Random feature expansions for deep Gaussian processes

Cutajar, Kurt; Bonilla, Edwin V; Michiardi, Pietro; Filippone, Maurizio
ICML 2017, 34th International Conference on Machine Learning, 6-11 August 2017, Sydney, Australia


Type:
Poster / Demo
City:
Sydney
Date:
2017-08-06
Department:
Data Science
Eurecom Ref:
5279
Copyright:
© EURECOM. Personal use of this material is permitted. The definitive version of this paper was published in ICML 2017, 34th International Conference on Machine Learning, 6-11 August 2017, Sydney, Australia and is available at :

PERMALINK : https://www.eurecom.fr/publication/5279