Ecole d'ingénieur et centre de recherche en Sciences du numérique

A probabilistic model of face mapping with local transformations and its application to person recognition

Perronnin, Florent;Dugelay, Jean-Luc;Rose, Kenneth W

IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), Volume 27, Issue 7, July 2005

This paper proposes a new measure of ?distance? between faces. This measure involves the estimation of the set of possible transformations between face images of the same person. The global transformation, which is assumed to be too complex for direct modeling, is approximated by a patchwork of local transformations, under a constraint imposing consistency between neighboring local transformations. The proposed system of local transformations and neighboring constraints is embedded within the probabilistic framework of a two-dimensional hidden Markov model. More specifically, we model two types of intra-class variabilities involving variations in facial expressions and illumination, respectively. The performance of the resulting method is assessed on a large data set consisting of four face databases. In particular, it is shown to outperform a leading approach to face recognition, namely, the Bayesian intra-/extra-personal classifier.

Document Doi Bibtex

Titre:A probabilistic model of face mapping with local transformations and its application to person recognition
Mots Clés:Biometrics;face recognition;image processing;hidden Markov model;distance
Type:Journal
Langue:English
Ville:
Date:
Département:Sécurité numérique
Eurecom ref:1551
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Bibtex: @article{EURECOM+1551, doi = {http://dx.doi.org/10.1109/TPAMI.2005.130}, year = {2005}, month = {07}, title = {{A} probabilistic model of face mapping with local transformations and its application to person recognition}, author = {{P}erronnin, {F}lorent and {D}ugelay, {J}ean-{L}uc and {R}ose, {K}enneth {W}}, journal = {{IEEE} {T}ransactions on {P}attern {A}nalysis and {M}achine {I}ntelligence ({PAMI}), {V}olume 27, {I}ssue 7, {J}uly 2005}, url = {http://www.eurecom.fr/publication/1551} }
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