Class-wise thresholding for robust out-of-distribution detection

Guarrera, Matteo; Jin, Baihong; Lin, Tung-Wei; Zuluaga, Maria A.; Chen, Yuxin; Sangiovanni-Vincentelli, Alberto
FADETRCV 2022, IEEE CVPR 2nd Workshop on Fair, Data-efficient, and Trusted Computer Vision, in conjunction with IEEE CVPR 2022, 20 June 2022, New Orleans, Louisiana, USA

We consider the problem of detecting Out-ofDistribution (OoD) input data when using deep neural networks, and we propose a simple yet effective way to improve the robustness of several popular OoD detection methods against label shift. Our work is motivated by the observation that most existing OoD detection algorithms consider all training/test data as a whole, regardless of which class entry each input activates (inter-class differences). Through extensive experimentation, we have found that such practice leads to a detector whose performance is sensitive and vulnerable to label shift. To address this issue, we propose a class-wise thresholding scheme that can apply to most existing OoD detection algorithms and can maintain similar OoD detection performance even in the presence of label shift in the test distribution. 


DOI
Type:
Conférence
City:
New Orleans
Date:
2022-06-20
Department:
Data Science
Eurecom Ref:
6875
Copyright:
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PERMALINK : https://www.eurecom.fr/publication/6875