Ecole d'ingénieur et centre de recherche en Sciences du numérique

Soft biometrics systems : Reliability and asymptotic bounds

Dantcheva, Antitza; Dugelay, Jean-Luc; Elia, Petros

BTAS 2010, 4th IEEE International Conference on Biometrics: Theory, Applications and Systems, September 27-29, 2010, Washington DC, USA

This work presents a preliminary statistical analysis on the reliability of soft biometrics systems which employ multiple traits for human identification. The analysis places emphasis on the setting where identification errors occur mainly due to cross-subject interference, i.e., due to the event that subjects share similar facial and body characteristics. Finally asymptotic analysis provides bounds which insightfully interpret this statistical behavior.

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Titre:Soft biometrics systems : Reliability and asymptotic bounds
Ville:Washington DC
Département:Sécurité numérique
Eurecom ref:3232
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Bibtex: @inproceedings{EURECOM+3232, doi = { }, year = {2010}, title = {{S}oft biometrics systems : {R}eliability and asymptotic bounds}, author = {{D}antcheva, {A}ntitza and {D}ugelay, {J}ean-{L}uc and {E}lia, {P}etros}, booktitle = {{BTAS} 2010, 4th {IEEE} {I}nternational {C}onference on {B}iometrics: {T}heory, {A}pplications and {S}ystems, {S}eptember 27-29, 2010, {W}ashington {DC}, {USA} }, address = {{W}ashington {DC}, {\'{E}}{TATS}-{UNIS}}, month = {09}, url = {} }
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