@conference{EURECOM+5469,
  author = {Ortona, Stefano and  Meduri, Vamsi and  Papotti, Paolo},
  title = {Robust discovery of positive and negative rules in knowledge-bases},
  booktitle = {ICDE 2018, 34th IEEE International Conference on Data Engineering, April 16-19, 2018, Paris, France},
  year = {2018},
  editor = {IEEE},
  address = {Paris},
  note = {© 2018 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.},
}